Electromagnetic Scattering Analysis of Sample Objects Within the Near-Field of a Subwavelength Aperture Utilizing FDTD Methods.

W. C. Symons* and Dr. R. A. Lodder
Department of Electrical Engineering and College of Pharmacy
University of Kentucky
A123 ASTeCC Building
Lexington, KY 40517-0286


Currently, Near-Field Scanning Optical Microscopes (NSOMs) are becoming increasingly popular analytical instruments. This popularity can be attributed to their ability to resolve images beyond the diffraction limit of conventional optical microscopes. Furthermore, NSOMs achieve this resolution while maintaining such important nondestructive characteristics of their conventional counterparts as the ability to gather spectral information of the sample. This subwavelength resolution is achieved by raster scanning a subwavelength aperture within a wavelength distance of a sample. Thus, the image resolution is determined by the aperture size, aperture/sample separation distance, and the step size of the raster scan.

In order to accurately interpret the image data of NSOM instruments, it is important to fully understand the near-field optical phenomena involving the electromagnetic scattering characteristics of sample objects illuminated within the near-field of a subwavelength aperture. To this end, a finite-difference time-domain (FDTD) model was derived and implemented according to the physical attributes of an NSOM instrument. Specifically, the NSOM instrument was modeled as a subwavelength aperture located within an infinite PEC plane which was then illuminated by an incident plane wave. Absorbing boundary conditions were then utilized to simulate the free space surroundings of the instrument. Furthermore, a near-field to far-field transformation was required to simulate radiation incident upon a detector located in the far-field. Once the basic model is implemented, it can then be utilized to simulate various samples of interest including thin PEC wires, PEC plates, and dielectric slabs. For example, thin PEC wire samples can be compared to closely spaced PEC plates. In this manner, it is possible to gain a better understanding of NSOM effects such as polarization, aperture/sample separation distance, and aperture size.